Digital Systems Testing And Testable Design Solution ^hot^ -

As chip sizes grow, the volume of test data becomes enormous. A 100-million-gate design may require gigabytes of test vectors. reduces this by:

Adding physical or logical access points to monitor critical signals. Fault Modeling: digital systems testing and testable design solution

Adding test points or multiplexers to specific "hard-to-reach" areas of the circuit. As chip sizes grow, the volume of test data becomes enormous

Running digital models against test patterns to verify correct functionality and measure "fault coverage"—the percentage of possible faults a test suite can catch. Core Benefits Digital Systems Testing And Testable Design Solution As chip sizes grow